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NDT Magazine Feature Article

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Friday, November 20, 2009

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Skyray XRF Article Featured in NDT Magazine


NDT Magazine with Skyray XRF Article
New York (www.skyrayxrf.com) - In the October edition of Quality Magazine, Skyray XRF had the opportunity to contribute an article about the evolution of x-ray fluorescence.  The featured article can be found in the Nondestructive Test (NDT) edition and at the magazines website. 


This article highlights the technological changes in both software and hardware that has allowed x-ray fluorescence to expand its reach as a testing solution for a variety of applications. 
Please review the article (linked here) and contact your Skyray XRF Sales Team to discuss the article, XRF Technology or your potential interest in the solutions it offers.

Article Linked here