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Comparing XRF and other Analysis Methods

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Wednesday, April 28, 2010

One of the most powerful X-ray Fluorescence Analyzers in the Skyray XRF Instrument line-up is the EDX-3600B.  This system is a top performer for a variety of application needs; including alloy verification, cement analysis and more, because of its high resolution detection systemThe UHRD is very similar in design and performance to the Silicon Drift Detection systems (SDD) that are growing in popularity.

While reviewing some information on Skyray XRF distributor websites, I found the following chart that compares the EDX-3600B Analyzer to other analysis methods.  Many of the advantages pointed out regarding the EDX-3600B would be similar for all Skyray XRF instruments.  It is the technological benefits of x-ray fluorescence that is truly highlighted with this chart - nondestructive, fast and accurate analysis for a great value.

The difference between 
X-ray Fluorescence (XRF) and Traditional Chemical Methods
Item
Traditional chemical method
EDX3600 family XRF
Speed
Slow, 10 ~ 30 min.
Quick, 1 ~ 5min.

 

 

Analytical result

 

 

Greatly influenced by operator, poor repeatability

 

 

No operator’s influence, high precision and repeatability

 

 

Labor intensity

 

 

High

 

 

Low, most done automatically

 

 

Elements analyzed

 

 

Only one element at a time

 

 

Multiple elements at a time

 

 

Chemical relativity

 

 

Analysis method varies with different sample chemical property

 

 

Pure physical method, no relativity with sample chemical property

 

 

Cost

 

 

High

 

 

Low

 

 

Skill requirement

 

 

High, long-time training

 

 

Low, simple training

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